✦ LIBER ✦

Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique

✍ Scribed by A. Aryasomayajula; S. Canovic; D. Bhat; M.H. Gordon; M. Halvarsson

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Atomic force microscopy (AFM) and X-ray

✍ Kah-Yoong Chan; Bee-San Teo 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 627 KB

Quantitative analysis of grain size in b

✍ J. He; J. Ye; E. J. Lavernia; D. Matejczyk; C. Bampton; J. M. Schoenung 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 384 KB

Structural analysis of radiation damage

✍ Dariusz Malczewski 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 257 KB

Evolution of Cu-Zn-Si oxide catalysts in

✍ T. P. Minyukova; N. V. Shtertser; A. A. Khassin; L. M. Plyasova; G. N. Kustova; 📂 Article 📅 2008 🏛 Springer 🌐 English ⚖ 482 KB

Proton-exchange membranes via the grafti

✍ S. Phadnis; M. Patri; B. C. Chakraborty; P. K. Singh; P. C. Deb 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 214 KB 👁 2 views