Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi 2 B 2 C Thin Film

✍ Scribed by Cao, G. H.; Skrotzki, W.; Simon, P.; Wimbush, S. C.; Holzapfel, B.

• Book ID: 126861297
• Publisher: American Chemical Society
• Year: 2005
• Tongue: English
• Weight: 899 KB
• Volume: 17
• Category: Article
• ISSN: 0897-4756
• DOI: 10.1021/cm050006t