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Transient Response of Charge Collection by Single Ion Strike in 4H-SiC MESFETs

✍ Scribed by Onoda, Shinobu; Iwamoto, Naoya; Ono, Shuich; Katakami, Shuji; Arai, Manabu; Kawano, Katsuyasu; Ohshima, Takeshi

Book ID: 121237051
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 239 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2009.2032395

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