Investigation of 4H-SiC Schottky diodes by ion and X-ray micro beam induced charge collection techniques

✍ Scribed by Manfredotti, C.; Vittone, E.; Paolini, C.; Olivero, P.; Lo Giudice, A.; Jaksic, M.; Barrett, R.

• Book ID: 122461142
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 362 KB
• Volume: 12
• Category: Article
• ISSN: 0925-9635
• DOI: 10.1016/S0925-9635(02)00387-4