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Transient photovoltage in GaN as measured by atomic force microscope tip

✍ Scribed by Reshchikov, M. A.; Sabuktagin, S.; Johnstone, D. K.; Morkoç, H.

Book ID
127301044
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
279 KB
Volume
96
Category
Article
ISSN
0021-8979

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The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]