Transient ionizing radiation effects on semiconductor integrated circuits : K. E. Kells and Dr. W. C. Bowman, Proc. IEEE Symposium on “Molecular Concepts in Microelectronics”, St. Louis, May 24, 25, 26 (1965), p. 5D-1

• Book ID: 113190361
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 101 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90117-x