Temperature coefficient of vacuum deposited thin film resistors patterned with abrasive-jet and electron-beam milling : Helmut Schwarz and E. T. Casterline. Proc. IEEE Symposium on “Molecular Concepts in Microelectronics”, St. Louis, May 24, 25, 26 (1965), p. 2B-1

• Book ID: 113190390
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 88 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90146-6