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Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry

✍ Scribed by Dávila, Abundio ;Kaufmann, Guillermo H. ;Pérez-López, Carlos


Book ID
115347198
Publisher
The Optical Society
Year
1998
Tongue
English
Weight
623 KB
Volume
37
Category
Article
ISSN
1559-128X

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