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Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

✍ Scribed by García, Bernardino Barrientos ;Moore, Andrew J. ;Pérez-López, Carlos ;Wang, Lingli ;Tschudi, Theo


Book ID
115348358
Publisher
The Optical Society
Year
1999
Tongue
English
Weight
186 KB
Volume
38
Category
Article
ISSN
1559-128X

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