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Transient Analysis of Single and Coupled Lines with Capacitively-Loaded Junctions (Comments)

✍ Scribed by Olson, K.S.; Guang-Wen Pan; Gilbert, B.K.

Book ID
114659396
Publisher
IEEE
Year
1987
Tongue
English
Weight
119 KB
Volume
35
Category
Article
ISSN
0018-9480

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A formulation for the transient analysis of high-speed digital interconnects with the use of generalized time-domain scattering parameters i s presented. The scattering parameters can represent any arbitrary N-port passive network under an arbitrary impedance reference system, and can euen be obtain