Transient analysis of resonant tunneling hot electron transistor (RHET)
โ Scribed by H. Ohnishi; N. Yokoyama; A. Shibatomi
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 230 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0038-1101
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