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Tradeoff between interconnect capacitance and RC delay variations induced by process fluctuations

✍ Scribed by Shigyo, N.

Book ID: 114538275
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 220 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.861585

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