Trade-offs in scan path and BIST implementations for RAMs

✍ Scribed by M. Nicolaidis; O. Kebichi; V. Castro Alves

• Book ID: 105021164
• Publisher: Springer US
• Year: 1994
• Tongue: English
• Weight: 1009 KB
• Volume: 5
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00972087