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A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis

✍ Scribed by D. Berthelot; M.L. Flottes; B. Rouzeyre


Book ID
110309623
Publisher
Springer US
Year
2001
Tongue
English
Weight
88 KB
Volume
17
Category
Article
ISSN
0923-8174

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