✦ LIBER ✦

Totally Split-Decomposable Metrics of Combinatorial Dimension Two

✍ Scribed by A. Dress; K.T. Huber; K.T. Huber

Book ID: 105740820
Publisher: Springer
Year: 2001
Tongue: English
Weight: 140 KB
Volume: 5
Category: Article
ISSN: 0218-0006
DOI: 10.1007/pl00001294

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Conformal dimension and combinatorial mo

Conformal dimension and combinatorial modulus of compact metric spaces

✍ Matias Carrasco Piaggio 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 150 KB

A comparative study of ADI splitting met

A comparative study of ADI splitting methods for parabolic equations in two space dimensions

✍ H.B. De Vries 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 692 KB

[Lecture Notes in Computer Science] Cryp

[Lecture Notes in Computer Science] Cryptography and Coding Volume 1746 || Combinatorial Structure of Finite Fields with Two Dimensional Modulo Metrics⋆

✍ Walker, Michael 📂 Article 📅 1999 🏛 Springer Berlin Heidelberg 🌐 German ⚖ 253 KB

This book constitutes the refereed proceedings of the 7th IMA Conference on Cryptography and Coding held in Cirencester, UK, in December 1999. The 35 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are error-correcting c

Measurement of fundamental chromatograph

Measurement of fundamental chromatography parameters in conventional and split-flow comprehensive two-dimensional gas chromatography-mass spectrometry: A focus on the importance of second-dimension injection efficiency

✍ Tranchida, Peter Quinto; Zoccali, Mariosimone; Franchina, Flavio Antonio; Dugo, 📂 Article 📅 2012 🏛 John Wiley and Sons 🌐 English ⚖ 649 KB

[IEEE 2012 23rd Annual SEMI Advanced Sem

[IEEE 2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2012.05.15-2012.05.17)] 2012 SEMI Advanced Semiconductor Manufacturing Conference - Enhanced process control of pitch split double patterning by use of CD-SEM critical dimension uniformity and local overlay metrics

✍ Halle, S. D.; Hotta, S.; Koay, C.; Chen, S.; Kato, T.; Yamaguchi, A.; Colburn, M 📂 Article 📅 2012 🏛 IEEE ⚖ 952 KB