Theoretical expressions for Ñuorescent intensity and scattered radiation in total reÑection experiments are presented. Trace elements in samples with di †erent matrices were studied. The contributions of the di †erent components were analyzed and a comparison with conventional x-ray Ñuorescence was
Total reflection XRF analysis of impurities in ice
✍ Scribed by Lucía E Arena; Héctor J Sánchez; Olga Nasello
- Book ID
- 113286545
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 261 KB
- Volume
- 100
- Category
- Article
- ISSN
- 0168-583X
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## Abstract This paper presents a new method for determining the microstructural location of impurities in polycrystalline ice, which involves allowing the ice to sublimate under vacuum and then identifying the concentrated impurities using energy dispersive X‐ray microanalysis in a low‐vacuum scan