Theoretical calculations of detection limits in total reflection XRF analysis

✍ Scribed by Héctor Jorge Sánchez

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 131 KB
• Volume: 28
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199901/02)28:1<51::aid-xrs308>3.0.co;2-o

✦ Synopsis

Theoretical expressions for Ñuorescent intensity and scattered radiation in total reÑection experiments are presented. Trace elements in samples with di †erent matrices were studied. The contributions of the di †erent components were analyzed and a comparison with conventional x-ray Ñuorescence was performed. Detection limits were calculated as a function of the sample thickness in both experimental situations. Very interesting conclusions were obtained regarding the contribution of the reÑected beam, the components of the background and the behavior of detection levels.