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Total dose effects on bipolar integrated circuits: characterization of the saturation region

โœ Scribed by Boch, J.; Saigne, F.; Ducret, S.; Schrimpf, R.D.; Fleetwood, D.M.; Iacconi, P.; Dusseau, L.


Book ID
126727752
Publisher
IEEE
Year
2004
Tongue
English
Weight
399 KB
Volume
51
Category
Article
ISSN
0018-9499

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