Topographic imaging of GaAs-microstructured samples by STM and SEM

✍ Scribed by J.M. Gómez-Rodríguez; L. Vázquez; A. Bartolomé; A.M. Baró; P. Grambow; D. Heitmann

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 474 KB
• Volume: 30
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(89)90065-x