Determination of the height of a microstructure sample by a SEM with a conventional and a digital photogrammetric method
✍ Scribed by M. Schubert; A. Gleichmann; M. Hemmleb; J. Albertz; J.M. Köhler
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 682 KB
- Volume
- 63
- Category
- Article
- ISSN
- 0304-3991
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