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TOF-ICISS study of surface damage formed by Ar ion bombardment on Si(100)

✍ Scribed by Koji Sumitomo; Ken-ichiroTanaka; Itsuo Katayama; Fumiya Shoji; Kenjiro Oura

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

TOF-ICISS study of surface damage formed

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Ag thin film growth on hydrogen-terminat

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Damage profiling of Ar+ sputtered Si(100

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The initial stage of Pb thin film growth

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Surface damage studies of ETFE polymer b

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Study by HREELS of elementary reactions

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