The imaging process in noncontact atomic force microscopy (AFM) is studied on a number of reactive surfaces, namely, the Takayanagi reconstructed Si(111), InP(110), and GaAs(110). We show that on these surfaces, the short-range dangling-bond type of interaction between the tip and the surface is dec
✦ LIBER ✦
Tip–surface interactions in atomic force microscopy: reactive vs. metallic surfaces
✍ Scribed by I. Štich; P. Dieška; R. Pérez
- Book ID
- 108417649
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 180 KB
- Volume
- 188
- Category
- Article
- ISSN
- 0169-4332
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