The imaging process in noncontact atomic force microscopy (AFM) is studied on a number of reactive surfaces, namely, the Takayanagi reconstructed Si(111), InP(110), and GaAs(110). We show that on these surfaces, the short-range dangling-bond type of interaction between the tip and the surface is dec
Dynamics of tip-substrate interactions in atomic force microscopy
✍ Scribed by Uzi Landman; W.D. Luedtke; A. Nitzan
- Publisher
- Elsevier Science
- Year
- 1989
- Weight
- 410 KB
- Volume
- 210
- Category
- Article
- ISSN
- 0167-2584
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