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Time-of-flight mass spectrometers with multiply reflected ion trajectories

✍ Scribed by H. Wollnik; M. Przewloka

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 400 KB
Volume: 96
Category: Article
ISSN: 0168-1176
DOI: 10.1016/0168-1176(90)85127-n

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