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Time domain temperature dependence simulation of MOS electronic circuits

✍ Scribed by V.B. Litovski; P.M. Petković

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 133 KB
Volume: 16
Category: Article
ISSN: 0010-4485
DOI: 10.1016/0010-4485(84)90182-9

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