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Simulation of time-dependent tunneling characteristics of MOS structures

✍ Scribed by R. Ramaswami; H.C. Lin

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 699 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90187-4

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