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Time-censored ramp tests with stress bound for Weibull life distribution

✍ Scribed by Bai, D.S.; Chun, Y.R.; Cha, M.S.

Book ID: 114555628
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 641 KB
Volume: 46
Category: Article
ISSN: 0018-9529
DOI: 10.1109/24.589934

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