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TID and Displacement Damage Effects in Vertical and Lateral Power MOSFETs for Integrated DC-DC Converters

✍ Scribed by Faccio, Federico; Allongue, B.; Blanchot, G.; Fuentes, C.; Michelis, S.; Orlandi, S.; Sorge, R.

Book ID: 120079678
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 578 KB
Volume: 57
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2010.2049584

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