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[IEEE 2011 IEEE International Conference on Advanced Power System Automation and Protection (APAP) - Beijing, China (2011.10.16-2011.10.20)] 2011 International Conference on Advanced Power System Automation and Protection - High voltage stress effects on power MOSFETs in switching DC-DC converters

โœ Scribed by Ozcelep, Yasin; Kuntman, Ayten; Kuntman, Hakan; Yarman, Siddik


Book ID
125485964
Publisher
IEEE
Year
2011
Weight
130 KB
Category
Article
ISBN
1424496209

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