Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices

✍ Scribed by El-Deeb, W.S.; Hashmi, M.S.; Smida, S.B.; Boulejfen, N.; Ghannouchi, F.M.

• Book ID: 114444068
• Publisher: The Institution of Engineering and Technology
• Year: 2010
• Tongue: English
• Weight: 441 KB
• Volume: 4
• Category: Article
• ISSN: 1751-8725
• DOI: 10.1049/iet-map.2009.0317