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An impedance and power flow measurement system suitable for on-wafer microwave device large-signal characterization

✍ Scribed by Walid S. El-Deeb; Souheil Bensmida; Noureddine Boulejfen; Fadhel M. Ghannouchi


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
400 KB
Volume
20
Category
Article
ISSN
1096-4290

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