𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Three dimensional strain measurements with x-ray energy dispersive spectroscopy

✍ Scribed by D. R. Black; C. J. Bechtoldt; R. C. Placious; M. Kuriyama


Book ID
112375610
Publisher
Springer-Verlag
Year
1985
Tongue
English
Weight
344 KB
Volume
5
Category
Article
ISSN
0195-9298

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Energy dispersive X-ray spectroscopy wit
✍ Hollerith, C.; Wernicke, D.; Bühler, M.; Feilitzsch, F.v.; Huber, M.; Hâhne, J πŸ“‚ Article πŸ“… 2004 πŸ› Elsevier Science 🌐 English βš– 317 KB

Shrinking feature sizes in semiconductor device production as well as the use of new materials demand innovation in device technology and material analysis. X-ray spectrometers based on superconducting sensor technology are currently closing the gap between fast energy dispersive spectroscopy (EDS)