Holistic calibration of three-dimensiona
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Evaristus Mainsah; Weiping Dong; Kenneth J. Stout
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Article
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1995
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Elsevier Science
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English
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Surface topography measuring instruments are usually calibrated by tracing profiles of a reference specimen. Measurements on these specimens, however, often show variation due, for example to local variations in the surface finish of the reference specimen or random starting positions of the profile