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Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers

✍ Scribed by Martínez, Amalia ;Rayas, Juan A. ;Rodríguez-Vera, Ramón ;Puga, Héctor J.

Book ID
115351636
Publisher
The Optical Society
Year
2004
Tongue
English
Weight
484 KB
Volume
43
Category
Article
ISSN
1559-128X

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We describe the construction and operation of a simple electronic speckle pattern interferometer which is sensitive to in-plane motions and rotations. The interferometer is extremely simple and easy to use. It uses a commercial digital still camera for image acquisition, and a personal computer for