Third-order nonlinear optical properties
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E. Xenogiannopoulou; P. Aloukos; S. Couris; E. Kaminska; A. Piotrowska; E. Dynow
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Article
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2007
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Elsevier Science
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English
โ 678 KB
Au films of thickness ranging between 5 and 52 nm were prepared by sputtering on quartz substrates and their third-order nonlinear optical response was investigated by Optical Kerr effect (OKE) and Z-scan techniques using 532 nm, 35 ps laser pulses. All prepared films were characterized by XRD, AFM