Third dimension of proximity effect correction (PEC)
β Scribed by Nezih Unal; Diana Mahalu; Olga Raslin; Daniel Ritter; Christoph Sambale; Ulrich Hofmann
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 332 KB
- Volume
- 87
- Category
- Article
- ISSN
- 0167-9317
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## Abstract In this communication, we present an improvement technique for the finiteβdifference timeβdomain (FDTD) method, in which an accurate solution can be achieved using a very coarse mesh if a weighted factor of the simulated PEC object dimension is properly selected. A uniform microwave str
In a raster scan lithography system, it is possible to correct proximity effects while the pattern is being exposed. This technique will be called run-time proximity correction. It is quite different from conventional methods that preprocess pattern data before exposure. It is a user transparent par