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Thin films: stress, strain and structure–property relations

✍ Scribed by Mark Yeadon; Zeng Kaiyang; Hng Huey Hoon; Ray D Twesten; Robin Abothu

Book ID: 108388502
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 31 KB
Volume: 424
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(02)00899-4

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📜 SIMILAR VOLUMES

Nominal model for structure-property rel

Nominal model for structure-property relations of chiral dielectric sculptured thin films

✍ J.A. Sherwin; A. Lakhtakia 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 816 KB

The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observ

Thin film optical properties in relation

Thin film optical properties in relation to film structure

✍ O. Hunderi 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 854 KB

Structure and composition related proper

Structure and composition related properties of titania thin films

✍ M Ghanashyam Krishna; S Kanakaraju; S Mohan 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 431 KB

Structure—Property Relations

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Intrinsic stress and structural properti

Intrinsic stress and structural properties of mixed composition thin films

✍ Sankur, Haluk ;Gunning, William J. ;DeNatale, Jeffrey F. 📂 Article 📅 1988 🏛 The Optical Society 🌐 English ⚖ 552 KB

Stress and strain in the vacuum deposite

Stress and strain in the vacuum deposited thin films

✍ S Tamulevičius 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 842 KB