Thin-film strained-SOI CMOS Devices-physical mechanisms for reduction of carrier mobility

✍ Scribed by Mizuno, T.; Sugiyama, N.; Tezuka, T.; Numata, T.; Maeda, T.; Takagi, S.

• Book ID: 114617472
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 443 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.829864