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Thin film microstructure modelling through line-segment simulation

✍ Scribed by L.J. Friedrich; S.K. Dew; M. Brett; T. Smy

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 684 KB
Volume: 266
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(95)06672-1

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