Thin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer–Neldel rule

✍ Scribed by P. Stallinga; H.L. Gomes

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 298 KB
• Volume: 7
• Category: Article
• ISSN: 1566-1199
• DOI: 10.1016/j.orgel.2006.10.003