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The Meyer-Neldel rule in field-effect measurements and the microscopic prefactor of the conductivity in a-Si: H

✍ Scribed by R. Schumacher; P. Thomas; K. Weber; W. Fuhs


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
240 KB
Volume
62
Category
Article
ISSN
0038-1098

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