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The Meyer–Neldel rule for diffusion in Si and SiGe

✍ Scribed by N.R. Zangenberg; A. Nylandsted Larsen


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
292 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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Trap states as an explanation for the Me
✍ P. Stallinga; H.L. Gomes 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 130 KB

It is shown that whenever traps, distributed exponentially in energy, are governing the conduction in electrical materials, a Meyer-Neldel observation is expected. This is a direct result of the model incorporating a high density of traps by Shur and Hack. Since this type of conduction is common for