✦ LIBER ✦

THIN FILM ELECTRON INTERFEROMETRY

✍ Scribed by WANG, Y. R.; KUBBY, J. A.; GREENE, W. J.

Book ID: 111650294
Publisher: World Scientific Publishing Company
Year: 1991
Tongue: English
Weight: 933 KB
Volume: 05
Category: Article
ISSN: 0217-9849
DOI: 10.1142/s0217984991001696

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thin-film phonon interferometry

✍ Nieden, Th.; Weis, O. 📂 Article 📅 1975 🏛 Springer 🌐 English ⚖ 198 KB

Thin Film Colorimetric Interferometry

✍ Hartl, M.; Krupka, I.; Poliscuk, R.; Liska, M.; Molimard, J.; Querry, M.; Vergne 📂 Article 📅 2001 🏛 Taylor and Francis Group 🌐 English ⚖ 390 KB

Thin Films and Interferometry

✍ Baumeister, Philip 📂 Article 📅 1973 🏛 The Optical Society 🌐 English ⚖ 456 KB

Measurement of thin film thickness by el

Measurement of thin film thickness by electronic speckle pattern interferometry

✍ Canan Karaaliog̃lu; Yani Skarlatos 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 362 KB

The surface profile of an Al thin film and its thickness have been observed by electronic speckle pattern interferometry (ESPI). The Michelson interferometer was used as our basic interferometric system to obtain interference fringes on a CCD camera. These interference fringes, arising from the path

Electronic speckle pattern interferometr

Electronic speckle pattern interferometry for mechanical testing of thin films

✍ L. Augulis; S. Tamulevic̆ius; R. Augulis; J. Bonneville; P. Goudeau; C. Templier 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 268 KB

The design, performance and principles of computerised control of an optical micro-electromechanical device combining microtensile device and electronic speckle pattern interferometry (ESPI) to test both elastic and plastic properties of thin metallic, dielectric as well as multilayered freestanding

Thin Films and Interferometry 13 March 1

Thin Films and Interferometry 13 March 1973

✍ Baumeister, Philip 📂 Article 📅 1973 🏛 The Optical Society 🌐 English ⚖ 330 KB