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Thickness-induced residual stresses in textured YBCO thin films determined by crystalline group method

✍ Scribed by Jie Xiong; Wenfeng Qin; Xumei Cui; Bowan Tao; Jinlong Tang; Yanrong Li


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
600 KB
Volume
455
Category
Article
ISSN
0921-4534

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