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Thickness fluctuations and electric field penetration in thin metal-insulator-metal structures

✍ Scribed by J. Antula

Publisher: Elsevier Science
Year: 1968
Tongue: English
Weight: 382 KB
Volume: 11
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(68)90128-7

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