Thickness fluctuations and electric field penetration in thin metal-insulator-metal structures : J. Antula, Solid-St. Electron.11 (1968), p. 1063

• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 95 KB
• Volume: 8
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(69)90247-9