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Thickness Estimation of Epitaxial Graphene on SiC Using Attenuation of Substrate Raman Intensity

✍ Scribed by Shriram Shivaraman; M. V. S. Chandrashekhar; John J. Boeckl; Michael G. Spencer


Book ID
107455516
Publisher
Springer US
Year
2009
Tongue
English
Weight
456 KB
Volume
38
Category
Article
ISSN
0361-5235

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