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Thickness effect on the exciton spectrum of thin PbBr2 films

✍ Scribed by N. K. Kramarenko; V. K. Miloslavskii


Publisher
John Wiley and Sons
Year
1971
Tongue
English
Weight
166 KB
Volume
48
Category
Article
ISSN
0370-1972

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The dielectric constant and the dielectric loss of TlSbSe 2 thin films, obtained via thermal evaporation of TlSbSe 2 crystals grown by Stockber-Bridgman technique, have been measured using ohmic Al electrodes in the frequency range 0.2-100 KHz and within the temperature interval 293-353 K. The capac