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Thickness-dependent relaxation of NiO(001) overlayers on MgO(001) studied by X-ray diffraction

✍ Scribed by M.A. James; T. Hibma


Book ID
117219650
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
216 KB
Volume
433-435
Category
Article
ISSN
0039-6028

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