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Thickness-dependent field emission from ZnTe films prepared by magnetron sputtering

โœ Scribed by Zhenxing Zhang; Jian Li; Haijun Zhang; Xiaojun Pan; Erqing Xie

Book ID
118461580
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
445 KB
Volume
549
Category
Article
ISSN
0925-8388

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The field emission properties of Ti-DLC films in diode and coplanar device structures were studied. An emission current density of 1.14 A/cm 2 could be obtained at an applied field of 33 V/mm and the threshold field was 24 V/mm for the coplanar emission structure. The silicon substrate was found to